FUNDAMENTAL STUDY OF HOT CARRIER INJECTION AND NEGATIVE BIAS TEMPERATURE INSTABILITY RELIABILITY IN MULTI BRIDGE CHANNEL FIELD EFFECT TRANSISTOR2022
COMPLETED
CHARGE-BASED COMPACT MODELING OF JUNCTIONLESS NANOWIRE TRANSISTOR WITH STRAIN FOR LOW POWER DIGITAL LOGIC CIRCUITS2019
COMPLETED
PERFORMANCE ANALYSIS OF SOI-BASED JUNCTIONLESS TRANSISTOR FOR 6T AND 8T SRAM CELLS2019
COMPLETED
UTM-TDR25.2(T2):ELECTRICAL PERFORMANCE AND RELIABILITY CHARACTERIZATION OF CARBON BASED DEVICE2018
COMPLETED
PERFORMANCE ANALYSIS OF GATE-ALL-AROUND (GAA) SILICON NANOWIRE (SINW) FLOATING GATE (FG) MEMORY DEVICE WITH HIGH-K DIELECTRICS AS TUNNEL BARRIER AND IT'S IMPACT ON ENDURANCE RELIABILITY2017
COMPLETED
STUDY OF DEVICE RELIABILITY AND VARIABILITY FROM PLANAR TO TWIN SI NANOWIRE FINFET (TSNWFET)2015
COMPLETED
SIMULATION STUDY OF DEVICE VARIABILITY AND RELIABILITY IN NANOSCALE 3D FINFET2015
COMPLETED
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