FOCUSED ION BEAM – SCANNING ELECTRON MICROSCOPE (FIB-SEM)
Brand : Zeiss Crossbeam 340
|1||Location||Dual Beam Microscope (FIB-SEM) Laboratory
|2||Details of Instrument||The Crossbeam 340 feature outstanding speed in material analysis and processing for a wide diversity of applications. Time to results is drastically reduced, for instance, time intensive 3D experiments that used to take several days can now be completed overnight.
The models bridge the gap between micro- and nano-patterning, enabling users to select up to 100 nA FIB current while retaining excellent spot profile.
Crossbeam 340 combines the imaging and analytical performance of the GEMINI column with the nanoscopic material processing and sample preparation of a next generation FIB. The models also feature open and easily extendable software architecture.
|3||Service Charge||Please refer to P.I.C for quotation.|
|4||Operation Hours||9.00 a.m. – 4.30 p.m.|
|5||Status||NOT AVAILABLE FOR BOOKING|
|6||P.I.C||Ahmad Muslehuddin bin Sarun
Nur Farhana Binti Hasmuni
|7||Download Booking Form||Click Here|
Updated on : 12/04/2017