ATOMIC FORCE MICROSCOPY
|1||Location:||Advanced Optical Microscope & Nano Raman Photolumeniscene Laboratory
|2||Details of Instrument:||Atomic Force Microscope, AFM is a surface technique that using a tiny tip (cantilever) as sensor to investigate surface of a sample.
Using AFM, it is possible for us to measure a roughness of a sample surface at a high resolution, in order to distinguish a sample based on its mechanical properties (Eg: hardness and roughness).
Example of sample :
• thin film
|3||Service Charge||Please refer to P.I.C for quotation.|
|4||Operation Hours||Sunday - Wednesday :
9.00am – 1.00 pm
2.00 pm - 4.30pm
9.00 am - 1.00 pm
2.00pm - 3.00 pm
|5||Status||Available for booking|
|6||P.I.C||Amy Zuria Binti Abdul Ajid
NUR SYAKIRAH BINTI MOHD NOH
|7||Download Booking Form||Click Here|