VARIABLE-PRESSURE SCANNING ELECTRON MICROSCOPE
Brand : JEOL JSM-IT300LV
|1||Location:||Microscope FE-SEM & VP-SEM Laboratory (01-46-01)|
|2||Details of Instrument:||The JSM-IT300LV is the latest addition to JEOL's popular series of tungsten/LaB6 low vacuum SEMs. With a high resolution of 3.0nm at 30kV and unsurpassed low kV performance, the JSM-IT300LV delivers amazing clarity for imaging the finest structures. Versatility and high resolution across the magnification range of 5X - 300,000X are the hallmarks of the JEOL tungsten SEM family.
The new JSM-IT300LV extends vacuum pressure range to 650 Pa, more than twice that of earlier models. In low vacuum mode, this capability enhances SEM imaging versatility for samples that are wet, oily, outgas excessively or are non-conductive without pretreatment.
JSM-IT300LV features multiple ports for analytical attachments such as: energy dispersive X-ray spectrometer (EDS), electron backscatter diffraction (EBSD), heating/cooling substages etc.
The large vacuum chamber accommodates samples up to 300mm in diameter and 80mm in height. When maintaining sample integrity is important, this feature makes it possible to image samples as large as a tennis shoe, automobile part, or full sized silicon wafer without alteration. A variety of sample holders are available for every type of sample including special requirements.
|3||Service Charge||Please refer to P.I.C for quotation.|
|4||Operation Hours||9.00 a.m. – 4.30 p.m.|
|5||Status||Available for booking|
|6||P.I.C||Ahmad Safuan Bin Borhan
Norhazalina binti Haliba
|7||Download Booking Form||Click Here|
Updated on : 12/04/2017