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Focused Ion Beam-Field Emission Electron Microscope (FIB-FESEM)

Brand : Zeiss Crossbeam 340


Dual Beam Microscope (FIB-SEM) Laboratory

Details of Instrument
The Crossbeam 340 feature outstanding speed in material analysis and processing for a wide diversity of applications. Time to results is drastically reduced, for instance, time intensive 3D experiments that used to take several days can now be completed overnight.

The models bridge the gap between micro- and nano-patterning, enabling users to select up to 100 nA FIB current while retaining excellent spot profile.

Crossbeam 340 combines the imaging and analytical performance of the GEMINI column with the nanoscopic material processing and sample preparation of a next generation FIB. The models also feature open and easily extendable software architecture.
There is two function for Crossbeam 340: FESEM & FIB

Service Charge
Please refer to P.I.C for quotation.

Operation Hours
9.00 a.m. – 4.30 p.m.

FIB – NOT AVAILABLE for booking
FESEM – Available for booking


Al Azhari bin Amir Hatib
07-561 0268
Ahmad Safuan Bin Borhan


Download Booking Form (click here )