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I88A4085

FOCUSED ION BEAM – SCANNING ELECTRON MICROSCOPE (FIB-SEM)

Brand : Zeiss Crossbeam 340

 

Location

Dual Beam Microscope (FIB-SEM) Laboratory
(01-40-01)

Details of Instrument
The Crossbeam 340 feature outstanding speed in material analysis and processing for a wide diversity of applications. Time to results is drastically reduced, for instance, time intensive 3D experiments that used to take several days can now be completed overnight.

The models bridge the gap between micro- and nano-patterning, enabling users to select up to 100 nA FIB current while retaining excellent spot profile.

Crossbeam 340 combines the imaging and analytical performance of the GEMINI column with the nanoscopic material processing and sample preparation of a next generation FIB. The models also feature open and easily extendable software architecture.
There is two function for Crossbeam 340: FESEM & FIB

Service Charge
Please refer to P.I.C for quotation.

Operation Hours
9.00 a.m. – 4.30 p.m.

Status
FIB – NOT AVAILABLE for booking
FESEM – Available for booking

P.I.C
(FIB)
Ahmad Muslehuddin bin Sarun
a.muslehuddin@utm.my
07-5610267
Nur Farhana Binti Hasmuni
nurfarhana@utm.my
07-5557723

(FESEM)
Ahmad Safuan Bin Borhan
a.safuan@utm.my
07-5610268

Ahmad Muslehuddin bin Sarun
a.muslehuddin@utm.my
07-5610267

Download Booking Form

FIB-SEM

FIB-SEM(industry)