Microscope FE-SEM & VP-SEM Laboratory (01-46-01)
Details of Instrument
Hitachi’s cold field emission technology with double condenser optics ensure the superb resolution and full control of probe current from 1pA to more than 5nA; ideal for observation of sensitive specimens and for elemental analysis (EDX)—where today’s SDD detectors achieve on the order of 10000 to 100000 counts per second.
The instrument offer a variety of stage, specimen chamber and signal detection system configurations to meet the wide range of customer-specific needs for indispensable ultra-high-resolution microscopy in the nanotechnology fields, such as semiconductors, electronics, catalysis and other functional materials, biotechnology, pharmaceuticals, and more.
Please refer to P.I.C for quotation.
9.00 a.m. – 4.30 p.m.
Available for booking
Ahmad Safuan Bin Borhan
Nor’Ain Abd Rahman
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