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I88A4085

FOCUSED ION BEAM – SCANNING ELECTRON MICROSCOPE (FIB-SEM)

Brand : Zeiss Crossbeam 340

NoDetails 
1Location
Dual Beam Microscope (FIB-SEM) Laboratory
(01-40-01)
2Details of InstrumentThe Crossbeam 340 feature outstanding speed in material analysis and processing for a wide diversity of applications. Time to results is drastically reduced, for instance, time intensive 3D experiments that used to take several days can now be completed overnight.

The models bridge the gap between micro- and nano-patterning, enabling users to select up to 100 nA FIB current while retaining excellent spot profile.

Crossbeam 340 combines the imaging and analytical performance of the GEMINI column with the nanoscopic material processing and sample preparation of a next generation FIB. The models also feature open and easily extendable software architecture.
3Service ChargePlease refer to P.I.C for quotation.
4Operation Hours9.00 a.m. – 4.30 p.m.
5StatusAvailable for booking
6P.I.CAhmad Muslehuddin bin Sarun
a.muslehuddin@utm.my
07-5610267

Nur Farhana Binti Hasmuni
nurfarhana@utm.my
07-5557723
7Download Booking FormClick Here
Updated on : 12/04/2017