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FIELD-EMISSION SCANNING ELECTRON MICROSCOPE
(FE-SEM)

Brand: Hitachi SU8020

NoDetails 
1Location
Microscope FE-SEM & VP-SEM Laboratory (01-46-01)
2Details of InstrumentFounded on an improved common electron optics platform that can achieve a stunning ultra low voltage imaging resolution of just 1.3nm at 1.0kV, Hitachi High-Technologies utilizes innovative detectors to optimize imaging performance, including the latest generation of Hitachi’s patented super ExB in-lens detection for energy filtering, charge suppression, and contrast control. The user-friendly GUI with 24.1-inch wide viewing monitor contributes to comfortable operation.

Hitachi’s cold field emission technology with double condenser optics ensure the superb resolution and full control of probe current from 1pA to more than 5nA; ideal for observation of sensitive specimens and for elemental analysis (EDX)—where today’s SDD detectors achieve on the order of 10000 to 100000 counts per second.

The instrument offer a variety of stage, specimen chamber and signal detection system configurations to meet the wide range of customer-specific needs for indispensable ultra-high-resolution microscopy in the nanotechnology fields, such as semiconductors, electronics, catalysis and other functional materials, biotechnology, pharmaceuticals, and more.
3Service ChargePlease refer to P.I.C for quotation.
4Operation Hours9.00 a.m. – 4.30 p.m.
5StatusAvailable for booking
6P.I.CAhmad Safuan Bin Borhan
a.safuan@utm.my
07-5610268

Ahmad Muslehuddin Bin Sarun
a.muslehuddin@utm.my
07-5610268
7Download Booking FormClick Here
Updated on : 03/12/2015