FIELD-EMISSION SCANNING ELECTRON MICROSCOPE
Brand: Hitachi SU8020
|1||Location||Microscope FE-SEM & VP-SEM Laboratory (01-46-01)|
|2||Details of Instrument||Founded on an improved common electron optics platform that can achieve a stunning ultra low voltage imaging resolution of just 1.3nm at 1.0kV, Hitachi High-Technologies utilizes innovative detectors to optimize imaging performance, including the latest generation of Hitachi’s patented super ExB in-lens detection for energy filtering, charge suppression, and contrast control. The user-friendly GUI with 24.1-inch wide viewing monitor contributes to comfortable operation.
Hitachi’s cold field emission technology with double condenser optics ensure the superb resolution and full control of probe current from 1pA to more than 5nA; ideal for observation of sensitive specimens and for elemental analysis (EDX)—where today’s SDD detectors achieve on the order of 10000 to 100000 counts per second.
The instrument offer a variety of stage, specimen chamber and signal detection system configurations to meet the wide range of customer-specific needs for indispensable ultra-high-resolution microscopy in the nanotechnology fields, such as semiconductors, electronics, catalysis and other functional materials, biotechnology, pharmaceuticals, and more.
|3||Service Charge||Please refer to P.I.C for quotation.|
|4||Operation Hours||9.00 a.m. – 4.30 p.m.|
|5||Status||Available for booking|
|6||P.I.C||Ahmad Safuan Bin Borhan
Ahmad Muslehuddin Bin Sarun
|7||Download Booking Form||Click Here|
Updated on : 03/12/2015