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RAMAN XPLORA PLUS
(RAMAN-AFM)

NoDetails 
1Location:
Nano Raman-Photoluminescence Spectroscopy Laboratory
(01-34-01)
2Details of Instrument:Raman-AFM

Raman technology is now integrated with outstanding scanning probe microscopy (SPM). The platform integrates Atomic Force Microscopy (AFM), near-field optical techniques (SNOM, NSOM), Scanning Tunneling Microscopy (STM), tuning fork techniques and confocal optical spectroscopy (Raman and fluorescence imaging) in one versatile instrument, for fast simultaneous co-localized measurements and Tip-Enhanced Raman Spectroscopy (TERS).

What laser wavelengths are used for Raman Xplora Plus?

 Visible: 532 nm Nd Yag
 Near infra-red: 785 nm Diode

Basic Operation

 Fully automated cantilever alignment insuring reproducible optimization of the AFM parameters from one tip to the next and from one user to another. (1) (5)

 Reliable repositioning of the probe on the sample within seconds. (1) (8)

 Drift compensated sample scanner with high resonance frequency brings reproducible images over long periods of time thanks to low vibration sensitivity. (5)

 Raman laser alignment by piezo-driven closed-loop objective scanner: shortest distance to the focus point for minimum drift. (6)

 Visual confirmation of the Raman laser alignment with independent video imaging, SPM detection and Raman mapping.
3Service ChargePlease refer to P.I.C for quotation.
4Operation HoursSunday - Wednesday :
9.00 am – 1.00 pm
2.00 pm - 4.30 pm

Thursday:
9.00 am - 1.00 pm
2.00 pm - 3.00 pm
5StatusAvailable for booking
6P.I.CAmy Zuria Binti Abdul Ajid
amyzuria@utm.my
07-5557589

Md Razali Bin Rehat
mdrazali@utm.my
07-5557786
7Download Booking FormClick Here
Updated on : 31/01/2016