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ATOMIC FORCE MICROSCOPY
(AFM)

NoDetails 
1Location:
Advanced Optical Microscope & Nano Raman Photolumeniscene Laboratory
01-34-01
2Details of Instrument:Atomic Force Microscope, AFM is a surface technique that using a tiny tip (cantilever) as sensor to investigate surface of a sample.

Using AFM, it is possible for us to measure a roughness of a sample surface at a high resolution, in order to distinguish a sample based on its mechanical properties (Eg: hardness and roughness).

Example of sample :
• microbes
• thin film
• fabric.
3Service ChargePlease refer to P.I.C for quotation.
4Operation HoursSunday - Wednesday :
9.00am – 1.00 pm
2.00 pm - 4.30pm

Thursday:
9.00 am - 1.00 pm
2.00pm - 3.00 pm
5StatusAvailable for booking
6P.I.CAmy Zuria Binti Abdul Ajid
amyzuria@utm.my
07-5557589

Mohd Izzam Bin Idrus
m.izzam@utm.my
07-7510269
7Download Booking FormClick Here
Updated on : 03/12/2015